A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
When using an analytically equipped scanning electron microscope (SEM), you aim to collect useful information from your samples. This entails asking particular questions based on your application. For ...
Vitamin C tablets’ surface roughness is key to defining their surface morphology and, therefore, their delivery rate and interaction time with external stimuli. Surface roughness can be observed via ...
The interaction volume of a characteristic X-Ray emission can be seen in Figure 1. Typical EDS analysis in an SEM is carried out at relatively high energy (greater than 10 kV), which results in a vast ...
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