One of the common modes of scanning probe microscopy (SPM) is Magnetic force microscopy (MFM). As indicated by the name, SPM is used to map magnetic properties. On the nanoscale, MFM probes local ...

In MFM, a magnetic-coated AFM probe interacts with magnetic field gradients from the sample, causing detectable forces on the probe's cantilever. To focus on magnetic interactions, MFM is often ...

Scientists have observed atomic magnetic fields, the origin of magnetic forces, for the first time using an innovative Magnetic-field-free Atomic-Resolution STEM they developed. The joint development ...

Traditional magnetic separators, however, present a challenge: they generate a magnetic force that is very high near the side of the vessel closest to the magnet and decreases rapidly with distance.

A standard single frequency AFM is comprised of a boron-doped silicon (Si) or silicon nitride (Si 3 N 4) cantilever with a length of a few micrometers and a single crystal diamond tip at the bottom of ...